On October 8-12, 2018, the 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII) sponsored by the Chinese Vacuum Society and the Electronic Materials Society of Chinese Institute of Electronics and undertaken by the Vacuum Interconnected Nanotech Workstation of the Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences was successfully held in Suzhou. Professor Cha Liangzhen was awarded the "SIMS Lifetime Achievement Award" by the Organizing Committee of the conference.

The secondary ion mass spectrometry technology is one of the most widely used surface analysis technologies. Professor Cha Liangzhen has been engaged in the mass spectrometry field for nearly 60 years, and has obtained many results. Over the past 40 years, he has been committed to the scientific research and talent training of secondary ion mass spectrometry, the vigorous development of the application of SIMS technology in China, and the promotion of the in-depth exchange with the international SIMS field. He is a pioneer in the discipline of secondary ion mass spectrometry in China, as well as the initiator and founder of the Chinese National Conference on Secondary Ion Mass Spectrometry.

The Organizing Committee of the conference specially invited Professor Chen Xu, Party Committee Secretary of Tsinghua University and Yang Hui, Director of SINANO to jointly present the award to Professor Cha Liangzhen. After presenting the award, a group photo was taken with Ding Sunan, Chairman of the Conference and Researcher of SINANO, Professor Ling Yongjian of National Tsing Hua University and Professor Weng Lutao of Hong Kong University of Science and Technology.

This conference provided a platform for academic seminars, technical exchanges and cooperation in the secondary ion mass spectrometry field in China, shoed the latest research results, and strongly promoted the application of secondary ion mass spectrometry technology in various fields.